Theoretical prediction of new C-Si alloys in C2/m-20 structure
Xu Xiangyang, Chai Changchun, Fan Qingyang, Yang Yintang
State Key Discipline Laboratory of Wide BandGap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an 710071, China

 

† Corresponding author. E-mail: qyfan_xidian@163.com

Abstract
Abstract

We study structural, mechanical, and electronic properties of C20, Si20 and their alloys (C16Si4, C12Si8, C8Si12, and C4 in structure by using density functional theory (DFT) based on first-principles calculations. The obtained elastic constants and the phonon spectra reveal mechanical and dynamic stability. The calculated formation enthalpy shows that the C–Si alloys might exist at a specified high temperature scale. The ratio of B/G and Poisson’s ratio indicate that these C–Si alloys in -20 structure are all brittle. The elastic anisotropic properties derived by bulk modulus and shear modulus show slight anisotropy. In addition, the band structures and density of states are also depicted, which reveal that C20, C16Si4, and Si20 are indirect band gap semiconductors, while C8Si12 and C4Si16 are semi-metallic alloys. Notably, a direct band gap semiconductor (C12Si8) is obtained by doping two indirect band gap semiconductors (C20 and Si20).

1. Introduction

As the first plentiful element on the earth, carbon has kinds of allotropes with a wide range of structures from superhard wide semiconductors to ultra-soft semimetals and even superconductors. The carbon allotropes have been investigated maturely and applied in many fields. The researches show that carbon allotropes own advanced mechanical and electronic properties. Xing et al.[1] came up with -20 carbon and compared with two other monoclinic symmetry carbon allotropes ( -16 carbon and M-carbon) and found that -20 carbon shows the greatest elastic modulus, anisotropy in Young’s modulus and hardness. Moreover, there are many other superhard carbon allotropes that have been predicted by researchers, such as O-carbon,[2] W-carbon,[3] F-carbon,[4] C-carbon,[5] lonsdaleite,[6] Z-carbon,[7] H-carbon,[8] ,[9] S-carbon,[10] Imma-carbon,[11] (9, 0)-carbon,[12] and so on. As the cornerstone of high-tech materials, silicon is widely applied in the production of high-purity semiconductors, high temperature materials, and optical fiber communication materials. Fan et al.[13] put forwards four novel silicon allotropes ( , -16, -20, and I-4); the mechanical and dynamical stability at ambient condition were proved. In addition, -16, -20, and I-4 phases were indirect band gap semiconductors materials with band gap of 0.56, 0.53, and 1.28 eV, respectively. The phase was a quasi-direct gap phase with a gap of 0.74 eV. The anisotropy properties show that the -20 phase exhibits greater anisotropy in shear elastic anisotropic factors.

C–Si alloys are attracting more and more attention in industry and academia[1423] because of their potential standout properties different from elemental carbon and silicon. In the converter steelmaking field, C–Si alloys are a new type of converter alloys, which can replace ferrosilicon, silicon carbide, and carburizer, further reducing the amount of deoxidizing agent. They have a good prospect in the process of converter for the stability, hardness, and mechanical properties which is superior to traditional technology. Recently, physicists are proceeding to find new kinds of C–Si alloys with splendid structural, mechanical, and electronic properties. Especially, direct band gap semiconductors are the direction researchers are interested in because it is easy for the energy transition to occur and they are appropriate for optoelectronic devices. Based on the global particle-swarm optimization algorithm and the density functional theory methods, Zhou et al.[24] predicted a novel energetically and thermally stable two-dimensional SiC2 siligraphene (g-SiC2) which is a semiconductor with a direct band gap of 1.09 eV. From first principles combined with a tight-binding model, Zhao et al.[25] proposed siligraphenes g-SiC3 and g-Si3C, both of which are dynamically stable and the spin–orbital coupling (SOC) band gaps are 0.431 meV (g-SiC3) and 0.089 meV (g-Si3C), much larger than those of graphene (0.0008 meV) and planar silicene (0.07 meV). Yan et al.[26] obtained three stable SimCn graphyne-like structures and studied through the structural relaxation, optimization, electronic structures as well as the thermal stability. Beside two-dimensional structures of silicon carbides, there are many works regarding the three-dimensional silicon carbide materials. Zhang et al.[27] proposed two new phases of Si8C4 and Si4C8 with the symmetry and studied their structural, elastic, and electronic properties systematically. Both of them are proved to be mechanically and dynamically stable. The band gaps of Si8C4 and Si4C8 are 0.74 eV and 0.15 eV, respectively, and both of them are indirect semiconductors. Fan et al.[28] investigated the structural, mechanical, anisotropic, and electronic properties of SiC2 and SiC4. The calculated results show that SiC2 and SiC4 are anisotropic materials and that SiC2 is an indirect band gap semiconductor while SiC4 is a quasi-direct band gap semiconductor. Tan et al.[29] proposed C–Si alloys (C8Si2, C6Si4, C4Si6, and C2Si8) in the orthorhombic structure of P2221 space group and proved the mechanical stability and elastic anisotropic. The concluded band structure exhibits that the proposed C–Si alloys are all indirect band gap semiconductors.

Based on the previous works, we propose four new structures of C–Si alloys (C16Si4, C12Si8, C8Si12, and C4Si16) in structure. In this paper, the lattice parameters and elastic constants are first calculated using first-principles calculations. Then the elastic modulus, Poisson’s ratio, hardness, elastic anisotropy, and Debye temperature are obtained. In addition, the band structures and density of states of C20, Si20, and their alloys are investigated and analyzed.

2. Theoretical method

The structural, mechanical and electronic properties of C20, Si20, and their alloys (C16Si4, C12Si8, C8Si12, and C4 in structure were studied utilizing Cambridge Serial Total Energy Package (CASTEP)[30] based on DFT.[31] The exchange correlation potential was performed with the generalized gradient approximation (GGA) in the form of Perdew–Burke–Ernzerhof (PBE),[32] PBE for solid (PBEsol),[33] and the local density approximation (LDA) in the form of Ceperley and Alder data parameterized by Perdew and Zunger (CA-PZ).[34, 35] To describe the core-valence interactions, the ultrasoft pseudo potentials were introduced. The cutoff energy of C20 (C16Si4, C12Si8, C8Si12, and C4 and was 400 eV and 340 eV, respectively. The valence electron structures of C and Si atoms are 2s22p2 and 3s23p2 and the grid partitions of k-points in the first irreducible Brillouin zone[36] were set as 7 16 8, 7 16 8, 7 15 7, 6 13 6, 5 13 6, and 5 10 5, respectively. For C20, Si20, and four new C–Si alloys phases, the structures were optimized using Broyden–Fletcher–Goldfarb–Shanno (BFGS)[37] minimization algorithm. The convergence tolerance was 5 10 eV/atom and the SCF (self-consistent field) tolerance was 5 10 eV/atom. On the atom, the maximum force is 0.01 eV/Å with the maximum stress 0.02 GPa and the maximum displacement Å.

3. Results and discussion

Figure 1 illustrates the crystal structures of C20, Si20, and their alloys (C16Si4, C12Si8, C8Si12, and C4Si16). They all belong to the space group of in a monoclinic system and every conventional cell includes 20 atoms. By utilizing PBE, PBEsol, and CA-PZ methods, the structures were optimized and the calculated lattice parameters (a, b, c, and β) are listed in Table 1 along with the theoretical value. From Table 1, it is clear that the lattice parameters of C20, Si20 in structure are excellently consistent with other theoretical values.[1, 13] From C20 to C–Si alloys, even to Si20, the lattice parameters (a, b, and c) increase with the number of Si atoms as shown in Fig. 2. Additionally, the curves of the GGA method (PBE and PBEsol) show a little better performance than the one of the LDA method (CA-PZ) in spite of the fact that all the curves in Fig. 2 almost coincide.

Fig. 1. (color online) Conventional cell crystal structures of C20, Si20, and C–Si alloys (red and blue spheres represent C and Si atoms).
Fig. 2. (color online) Calculated lattice parameters (a, b, and of C20, Si20, and C–Si alloys by PBE, PBEsol, and CA-PZ methods.
Table 1.

Calculated lattice parameters (a, b, c in unit Å and β in unit degree) using PBE, PBEsol, and CA-PZ along with theoretical values.

.

As we all know, the elastic constants of a conventional cell are very significant in researching on the mechanical properties of a crystal, which offer information about the stability and stiffness of the materials. For monoclinic symmetry space group of , there are thirteen independent elastic constants Cij , , C33, C44, C55, C66, C12, C13, C15, C23, C25, C35, and . The values of elastic constants which were obtained by introducing a small finite strain to the equilibrium structure are listed in Table 2. The elastic constants of C20 and Si20 were consistent with theoretical value. A stable monoclinic structure must satisfy the following mechanical stability criteria:[38]

Table 2.

Calculated elastic constants (in unit GPa) and elastic moduli (in unit GPa) of C20, C16Si4, C12Si8, C8Si12, C4Si16, and Si20.

.

After verification, it can be found that all the elastic constants obey the mechanical stability criteria, which indicates that these six crystals are mechanically stable. To confirm the dynamic stability of their alloys in -20 phase (C16Si4, C12Si8, C8Si12, and C4Si16), the phonon spectra of C16Si4, C12Si8, C8Si12, and C4Si16 in -20 phase are displayed in Figs. 3(a), 3(b), 3(c), and 3(d). There is no imaginary frequency along the whole Brillouin zone form Fig. 3, indicating that these alloys are all dynamically stable.

Fig. 3. The phonon spectra of C–Si alloys.

In order to evaluate the relative stability of C–Si alloys, the phase diagram is calculated based on the regular-solution model.[39] The formation energy of C–Si alloys is defined as follows:

where is the total energy of C–Si alloys, while m and n are the number of C and Si atoms in a conventional cell. The chemical potentials and are the total energy of C20 and Si20, respectively. The formation energies of C–Si alloys using PBE, PBEsol, and CA-PZ functions are depicted in Fig. 4. The formation energies are all positive, and the alloys might exist at a specified high temperature scale, due to the entropy effects considered. The Helmholtz free energy can be expressed as
where is the internal energy and T is the absolute temperature of the surroundings. Moreover, for the regular solution model of alloys, the entropy can be given as
where R represents the gas constant. From Eqs. (10) and (11), it can be seen that the C–Si alloys in structure can be synthesized in a high temperature environment.

Fig. 4. (color online) The formation energy of C–Si alloys.

As we all know, the elastic constants C11, C22, and C33 character the resistance to linear compression in x, y, and z directions,[40] respectively. The elastic constants C44, C55, and C66 are interpreted by the resistances of the crystal with respect to the shear strain at (100), (010), and (001) planes and are regarded as the important parameters relating to the shear modulus. Figure 5(a) shows the elastic constants Cii and it is clear that the calculated C11, C22, and C33 are very large among the thirteen elastic constants, which indicates that they are very incompressible under uniaxial stress along x, y, and z axes. It is easily found that C11 is higher than C33 for these six crystals except C16Si4. Thus, it can be considered that the z axis is more compressible than the x axis for C20, C12Si8, C8Si12, C4Si16, and Si20. In addition, C11 is slightly higher than C22 for all these six crystals indicating that the y axis is a little more compressible than the x axis. In cases of C44, C55, and C66, for all the studied crystals in this work, C44 is larger than C55, so the resistance to the shear strain at the (100) plane is stronger than that of the (010) plane. For C16Si4, C12Si8, C8Si12, C4Si16, and Si20, the resistance at (100) is larger than that of the (001) plane. As a whole, with the increasing components of Si atoms, the elastic constants Cii decrease thus the compression property increases.

Fig. 5. (color online) Elastic constants Cii and elastic moduli (B, G, and of C20, C16Si4, C12Si8, C8Si12, C4Si16, and Si20.

Then using the data of Table 2, the elastic moduli can be calculated. To obtain the bulk modulus B (in unit GPa) and the shear modulus G (in unit GPa), which represent the volumetric elasticity and shearing direction under opposing forces, Voigt[41] proposed the upper limits and , while Reuss[42] proposed the lower limits and in the following equations:[43]

However, the arithmetic average of Voigt and Reuss bounds termed as Voigt–Reuss–Hill (VRH)[4143] approximations is the acknowledged best method to calculate the bulk modulus and the shear modulus. From VRH approximations, we have and . The Young modulus E is the ratio of stress to strain and can be obtained by .[43] Universally, the larger the Young’s modulus E is, the stiffer the material is prone to be. Poisson’s ratio [43] is the ratio of the expansion fraction to compression fraction.

Aforementioned elastic moduli, i.e., bulk modulus B (in unit GPa), shear modulus G (in unit GPa), Young’s modulus E (in unit GPa), and Poisson’s ratio v were calculated and shown in Table 3. It is found that the bulk modulus B, the shear modulus G, and the Young modulus E all decrease by 79.72%, 88.31%, and 86.78% with the increase of the Si atoms, meaning that the stiffness decreases. Besides, the slopes of the B, G, and E curves turn smaller and smaller. For the C–Si alloys, the variation tendency of the bulk modulus B and the shear modulus G are almost the same. For the elastic moduli and Poisson’s ratio, the given data of this work are consistent with theoretical values. The ratio of the bulk modulus to the shear modulus ( ) proposed by Pugh[44] indicates the ductile or brittle feature of a material. If , the material manifests the ductile feature, otherwise, the brittle feature. The crystal with Poisson’s ratio v larger than 0.26 belongs to ductile material. From Table 3, we can see that B/G for C20, Si20 and their alloys (C16Si4, C12Si8, C8Si12 and C4 is less than 1.75 and Poisson’s ratio v is less than 0.26, it is concluded that they are all brittle crystals.

Table 3.

Calculated elastic moduli (in unit GPa) and Poisson’s ratio v of C20, Si20, C16Si4, C12Si8, C8Si12, and C4Si16.

.

The hardness of material can express the elastic and plastic properties as follows:

The calculated hardness of C20, C16Si4, C12Si8, C8Si12, C4Si16, and Si20 are 80, 41, 32, 21, 11, and 9 GPa, respectively, with a tendency of nonlinear decrease. The hardness values of C20 and C16Si4 are larger than 40 GPa, thus they are superhard materials while C12Si8 and C8Si12 are hard materials.

The elastic anisotropy is another crucial parameter which relates to the probability of inducing micro-cracks in materials. There are many descriptions of anisotropy named the compression anisotropy and the shear anisotropy which represent the percentage of the bulk modulus and shear modulus, respectively, and the universal anisotropy index can be obtained anisotropy as follows:[45]

From the three anisotropy formulas, it is obvious that , , and are all not less than zero. If , , and are equal to zero, the anisotropy eliminates and the crystal turns to isotropic material. If and equal to 1, then the anisotropy is maximum. From Table 4 and Fig. 6(a), it is easy to be observed that these six studied crystals show weak anisotropy since the values of and are very small. Meanwhile, the column of is a little smaller than the column indicating that the anisotropy is inconspicuous in bulk modulus. As shown in Ref. [13], for silicon allotropes, the value of in structure is larger than that of , -16, and I-4 structures, which indicates that the anisotropy of Si20 in structure is greatest. In our work, the values of of C4Si16 and C12Si8 are 0.594 and 0.540, respectively, larger than Si20 (0.241), so C4Si16 and C12Si8 own stronger universal anisotropy.

Fig. 6. (color online) Calculated elastic anisotropy factors (a), shear anisotropy factors (b) of C20, C16Si4, C12Si8, C8Si12, C4Si16, and Si20.

The shear anisotropic factors provide a measure of the degree of anisotropy in the bonding between atoms in different planes. The shear elastic anisotropic factors A1, , and A3 can be defined as:[46]

where describes the (100) shear plane between [011] and [010] directions, describes the (010) shear plane between [101] and [001] directions, and describes the (001) shear plane between [100] and [010] directions, respectively. Table 4 gives the values of the shear anisotropy factors (A1, A2, and figure 6(b) describes the gaps between the factors and horizontal line of 1. If A1, A2, and A3 are equal to one, the crystal belongs to isotropic material. Otherwise, the larger the gap is, the stronger anisotropy the shear plane shows. Observing Fig. 6(b), for C20 and C16Si4, the shear planes of (010) and (001) show more anisotropy; for C12Si8, the shear planes of (100) and (010) behave with the same anisotropic character while the (001) plane has the more obvious anisotropy; C8Si12 behaves with the similar small anisotropic character in different directions; for C4Si16 and Si20, they have anisotropy in these three planes. At the shear plane of (100), C20, Si20, and their alloys show weaker shear anisotropy than the other two planes. At the (010) plane, C16Si4 has the strongest shear anisotropy and at the (001) plane C12Si8 and C4Si16 have stronger shear anisotropy.

Table 4.

Compression and shear anisotropy percent factors ( and , universal anisotropy index ( and shear anisotropy factors (A1, A2, and .

.

As a fundamental parameter for evaluating the chemical bonding characteristics and the thermal properties of materials, the Debye temperature D is generally used to distinguish whether a crystal locates at the high temperature zone or low temperature zone. If the temperature , the energy is satisfying the Dulong-Petit law, otherwise, all the modes of high frequency lose efficacy. Combining the electronic structures and the elastic moduli, the Debye temperature can be expressed by the following equations:[47, 48]

where h is the Planck’s constant, is Boltzmann’s constant, is the Avogadro’s constant, n is the number of atoms in the molecule, M is the molecular weight, ρ is the density of crystal, is the average sound velocity, and represent the compressional and shear sound velocities, respectively. The calculated sound velocities and Debye temperature are listed in Table 5. In general, the melting temperature and the Debye temperature are decided by the interatomic bonding, the bonds between C atoms are larger than those of Si atoms, so the Debye temperature gets lower with the increase of the Si atoms, just as Table 5 shows. The order of the Debye temperature in Table 5 is , consistent with the order of the bulk modulus, shear modulus and Young’s modulus.

Table 5.

Density (ρ in units g/cm3), compressional, shear, and average elastic sound velocities ( , , in units m/s) as well as Debye temperature ( in unit K).

.

The electronic band structure describes the law of the electronic motion in a solid and determines the fundamental physical and chemical properties of materials. As is well known, in calculating the band gap, the density functional theory method underestimates the results by 30%–50% compared to the true band gap. The calculated band gaps of C20, Si20, C16Si4, C12Si8, C8Si12, and C4Si16 are listed in Table 6 by PBE, PBEsol, and CA-PZ methods. The band structure-based PBE are illustrated in Fig. 7 with the dashed line of zero energy representing the Fermi level ( ). The band gap generally refers to the energy difference between the valence band maximum (VBM) and the conduction band minimum (CBM). The minimal-energy state in the conduction band and the maximal-energy state in the valence band are each characterized by a certain crystal momentum (k-vector) in the Brillouin zone. From Fig. 7, it is obvious to obtain that C20, C16Si4, and Si20 are all indirect band gap semiconductors with band widths of 4.02 eV, 0.33 eV, and 0.53 eV, respectively, while C12Si8 is a direct band gap semiconductor with band width of 0.17 eV. The remaining C8Si12 and C4Si16 are semi-metallic alloys. Notably, a direct band gap semiconductor (C12Si8) is obtained by doping two indirect band gap semiconductors (C20 and Si20). Meaningfully, C12Si8 is very appropriate for making optoelectronic devices.

Fig. 7. (color online) Partial densities of states of C20, Si20, and C–Si alloys.
Table 6.

The calculated band gap (in unit eV) of C20, C16Si4, C12Si8, C8Si12, C4Si16, and Si20.

.

For illustrating the fundamental features of the chemical bonding in , the partial density of states (PDOS) were calculated as shown in Fig. 8. For C20, C-s states make a main contribution in the energy from −22.5 eV to −12.5 eV while C-p states contribute mainly in energy from −12.5 eV to and 4.02 eV to 10 eV. For C16Si4, C-s states make a main contribution in energy from −22 eV to −13 eV and C-p states contribute mainly in energy from −13 eV to and 0.33 eV to 5.5 eV. In addition, Si5-p contributes mainly in energy from 0.33 eV to 5.5 eV. For C12Si8, C-s states make a main contribution in energy from −18 eV to 11 eV while C-p states contribute mainly in energy from −11 eV to and 0.17 eV to 5.2 eV. It is also found that Si1-p and Si5-p contribute mainly in energy from 0.17 eV to 5.2 eV. For C8Si12, C-s states make a main contribution in energy from −17.5 eV to −10.5 eV while C-p states contribute mainly in energy from −10.5 eV to 3.2 eV. For C4Si16, C-s states make a main contribution in energy from −16 eV to −8.5 eV while C-p states contribute mainly in energy from −8.5 eV to 3.1 eV. Besides, C4-s contributes mainly in energy from −16 eV to −14 eV. For Si20, Si-s states make a main contribution in energy from −12 eV to −6 eV while Si-p states contribute mainly in energy from −6 eV to and 0.53 eV to 3.35 eV.

Fig. 8. (color online) Electronic band structures of C20, Si20, and C–Si alloys.
4. Conclusion and perspectives

In this work, the structural properties, elastic properties, anisotropies, and electronic properties of C16Si4, C12Si8, C8Si12, and C4Si16 in structure are investigated. The mechanical stability and the dynamic stability are confirmed by the elastic constants and phonon spectra, respectively. It can be found that the B/G and Poisson’s ratio all decrease with the increment of the Si atoms, which indicates that they are all brittle crystals. Through the analysis of the compression anisotropy, shear anisotropy, and universal anisotropy factors, C–Si alloys perform a smaller anisotropy. By calculating the band structures, the results show that C16Si4 is indirect band gap semiconductor while C12Si8 is a direct band gap semiconductor, C8Si12 and C4Si16 are semi-metallic alloys. Notably, a direct band gap semiconductor (C12Si8) is obtained by doping two indirect band gap semiconductors (C20 and Si20).

Reference
[1] Xing M J Li B H Yu Z T Chen Q 2015 Commun. Theor. Phys. 64 237
[2] Wang J T Chen C F Kawazoe Y 2012 Phys. Rev. 85 033410
[3] Wang J T Chen C F Kawazoe Y 2011 Phys. Rev. Lett. 106 075501
[4] Tian F Dong X Zhao Z S He J L Wang H T 2012 J. Phys.: Condens. Matter 24 165504
[5] Li D Bao K Tian F B Zeng Z W He Z Liu B B Cui T 2012 Phys. Chem. Chem. Phys. 14 4347
[6] Li Q K Sun Y Li Z Y Zhou Y 2011 Scr. Mater. 65 229
[7] Zhou R L Zeng X C 2012 J. Am. Chem. Soc. 134 7530
[8] He C Y Sun L Z Zhang C X Peng X Y Zhang K W Zhong J X 2012 Solid State Commun. 152 1560
[9] Xu N Li J F Huang B L Wang B L 2016 Chin. Phys. 25 016103
[10] Sheng X L Yan Q B Ye F Zheng Q R Su G 2011 Phys. Rev. Lett. 106 155703
[11] Wei Q Zhang M G Yan H Y Lin Z Z Zhu X M 2014 Europhys. Lett. 107 27007
[12] Xu N Li J F Huang B L Wang B L 2015 Chin. Phys. 24 066102
[13] Fan Q Y Chai C C Wei Q Yan H Y Zhao Y B Yang Y T Yu X H Liu Y Xing M J Zhang J Q Yao R H 2015 J. Appl. Phys. 118 185704
[14] Nakashima S Harima H 1997 Phys. Stat. Sol. 39 162
[15] Walter C Oestreich M 2008 Angew. Chem. Int. Ed. 47 3818
[16] Han J C Hu P Zhang X H Meng S H Han W B 2008 Compos. Sci. Technol. 68 799
[17] Zimmermann J Hilmas G Fahrenholtz W 2008 Mater. Chem. Phys. 112 140
[18] Gasch M Ellerby D Irby E Beckman S Gusman M Johnson S 2004 J. Mater. Sci. 39 5925
[19] Zhu S Fahrenholtz W Hilmas G 2007 J. Eur. Ceram. Soc. 27 2077
[20] Dou S X Soltanian S Horvat J Wang X L Zhou S H Ionescu M Liu H K 2002 Appl. Phys. Lett. 81 3419
[21] Guo S Yang J Tanaka H Kagawa Y 2008 Compos. Sci. Technol. 68 3033
[22] Lomello F Bonnefont G Leconte Y Herlin-Boime N Fantozzi G 2012 J. Eur. Ceram. Soc. 32 633
[23] Wang R Z Li W G Li D Y Fang D N 2015 J. Eur. Ceram. Soc. 35 2957
[24] Zhao M W Zhang R Q 2014 Phys. Rev. 89 195427
[25] Zhou L J Zhang Y F Wu L M 2013 Nano Lett. 13 5431
[26] Yan X Xin Z H Tian L J Yu M 2015 Comput. Mater. Sci. 107 8
[27] Zhang Q Wei Q Yan H Y Fan Q Y Zhu X M Zhang J Q Zhang D Y 2016 Z. Naturforsch., A. Phys. Sci. 71 387
[28] Fan Q Y Chai C C Wei Q Yang Y T 2016 Materials 9 333
[29] Tan L Chai C C Fan Q Y Yang Y T 2016 Chin. J. Phys. 54 700
[30] Clark S J Segall M D Pickard C J Hasnip P J Probert M I J Refson K Payne M C 2005 Z. Kristallogr. 220 567
[31] Hohenberg P Kohn W 1964 Phys. Rev. 136 B864
[32] Perdew J P Burke K Ernzerhof M 1996 Phys. Rev. Lett. 77 3865
[33] Perdew J P Ruzsinszky A Csonka G I Vydrov O A Scuseria G E Constantin L A Zhou X Burke K 2008 Phys. Rev. Lett. 100 136406
[34] Ceperley D M Alder B J 1980 Phys. Rev. Lett. 45 566
[35] Perdew J P Zunger A 1981 Phys. Rev. 23 5048
[36] Moukhorst J Pack J D 1996 Phys. Rev. 54 16533
[37] Pfrommer B G Côté M Louie S G Cohen M L 1997 J. Comput. Phys. 131 233
[38] Wu Z J Zhao E J Xiang H P Hao X F Liu X J Meng J 2007 Phys. Rev. 76 054115
[39] Swalin R A 1962 Thermodynamics of Solids New York Wiley
[40] Hao X P Cui H L 2014 J. Korean Phys. Soc. 65 45
[41] Voigt W 1928 Lehrburch der Kristallphysik Leipzig Teubner
[42] Reuss A 1929 Z. Angew. Math. Mech. 9 49
[43] Hill R 1952 Proc. Phys. Soc. London 65 349
[44] Pugh S F 1954 Philos. Mag. 45 823
[45] Fan Q Y Wei Q Yan H Y Zhang M G Zhang Z X Zhang J Q Zhang D Y 2014 Comput. Mater. Sci. 85 80
[46] Connétable D Thomas O 2009 Phys. Rev. 79 094101
[47] Anderson O L 1963 J. Phys. Chem. Solids 24 909
[48] Panda K B Ravi K S 2006 Comput. Mater. Sci. 35 134